Completed Physics & Astronomy Chemistry

University of Southampton - Equipment Account

In plain English

AI plain-English summary

X-ray beams will soon probe the atomic structures of materials that have long been too difficult to study—thin films, tiny grains, and single components in optical grids. Most X-ray diffraction equipment is designed for large, uniform crystalline samples. This leaves out materials critical to modern technology: the thin layers in solar cells and computer chips, the microscopic grains in minerals that control how they interact with water or pollutants, and the individual elements in metamaterials that manipulate light. Without dedicated instruments, researchers cannot measure atomic spacings, crystal orientations, or stress in these samples. This grant funds advanced diffraction equipment tailored to those neglected sample types. Success means engineers and materials scientists can finally see exactly how a thin film bonds to its substrate, how a single grain in a rock weathers, or how a tiny resonator in an optical grid behaves. That knowledge directly feeds into better batteries, more efficient solar panels, faster electronics, and improved understanding of environmental processes like carbon capture in minerals. The research is applied—the equipment exists to solve specific, known problems in energy, electronics, and environmental science.

View original technical description
X-ray diffraction is the main technique by which scientists and engineers study the structures of crystalline materials, however some sample types are often neglected due to the requirement for specialised instrumentation and expertise. This proposal provides advanced equipment to apply diffraction and related methods to a series of lesser-studied sample types of great importance in technology and in understanding environmental processes. These include thin layers of material on surfaces, where information about atomic separations, particle sizes, crystal orientation and changes in the size of the lattice due to interactions with the underlying material can be obtained. This will be critical to the understanding of a range of functional materials with applications in energy conversion and storage, electronics, optoelectronics and engineering. It will also be possible to study very small regions of a material, this is important in examination of single components or regions of a sample where variations are important in understanding properties. Sample types include minerals, where the structure of individual grains will contribute to knowledge of interactions with the environment, and single components of grids of material designed to have specific interactions with light.

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Researchers

Judith Petts (Principal Investigator)Philip Arthur Nelson (Principal Investigator)Simon Spearing (Principal Investigator)

Related Research

Grants with similar aims, by meaning.

Enabling microfocus & thin film X-ray scattering at the University of Southampton
Upgrading Single Crystal X-Ray Diffraction for Solid-state Characterisation of Molecules and Materials
CSEC-Based Facility for Advanced X-ray Characterisation of Materials
A single-crystal X-ray diffractometer for the structural analysis of molecular compounds, macromolecules and materials
An Electron Diffractometer for Nanomaterial Structure Characterisation

Original classification

Research Grant

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