High Resolution Ion Beam Analysis Facility

A new generation of detectors at the University of Surrey’s Ion Beam Centre will let researchers identify the chemical bonding states of elements buried microns beneath a material’s surface, while the sample sits in ordinary air. The centre has spent four decades using MeV ion beams to analyse materials for UK academia and industry—from ancient artefacts and medical implants to semiconductors and ceramics. Until now, standard techniques such as Rutherford Back Scattering and Particle Induced X-ray Emission could map elemental composition but could not distinguish, for example, whether a carbon atom was part of a diamond or a polymer. The new detectors resolve small chemical shifts in X-ray signals, revealing bonding states at depth without needing a vacuum. The ion beams are so gentle that even delicate samples remain undamaged. If the upgrade works as intended, UK researchers will gain a non-destructive tool for probing layered materials—coatings, electronic devices, or corrosion layers—in realistic conditions. This could improve quality control in manufacturing, help preserve cultural heritage objects, or accelerate development of new photonic and electronic materials. The facility is a shared national resource, so the impact will spread across multiple fields rather than targeting a single application.